The association between null mutations in the filaggrin gene and contact sensitization to nickel and other chemicals in the general population

J P Thyssen, J D Johansen, A Linneberg, T Menné, N H Nielsen, M Meldgaard, P B Szecsi, Steen Stender, B C Carlsen

101 Citations (Scopus)

Abstract

It was recently shown that filaggrin gene (FLG) null mutations are positively associated with nickel sensitization. We have hypothesized that histidine-rich filaggrin proteins in the epidermis chelate nickel ions and prevent their skin penetration and exposure to Langerhans cells. Furthermore, we have proposed that the low degree of genetic predisposition to nickel sensitization found by a Danish twin study was explained by a high prevalence of ear piercing among participants resulting in 'bypassing' of the filaggrin proteins.
Original languageEnglish
JournalBritish Journal of Dermatology
Volume162
Issue number6
Pages (from-to)1278-85
Number of pages8
ISSN0007-0963
DOIs
Publication statusPublished - 1 Jun 2010

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